Hill, J and Wagoire, W W and Ortiz, R and Stølen, O (2000) Cross prediction in bread wheat germplasm using single seed descent lines. Euphytica, 113 (1). pp. 65-70. ISSN 0014-2336
PDF
- Published Version
Restricted to ICRISAT users only Download (53kB) | Request a copy |
Abstract
Populations of F6 recombinant inbred lines, generated by single seed descent from a half diallel among eight bread wheat lines adapted to the East African highlands, were used to identify those crosses that were more likely to produce cultivars which combined resistance to yellow rust with improved yield. Crosses having the most resistant line as one parent offered the best prospect of success, particularly those which produced F1hybrids exhibiting better parent heterosis. For plot grain yield there was a highly significant correlation between the observed and predicted rankings of the recombinant inbred line populations for the proportion of individual lines equalling or surpassing the target value. For yellow rust severity, however, this correlation was non-significant when a target value of zero was used. Adopting a slightly less stringent target of 0.25, coupled with the omission of two aberrant populations, increased this correlation significantly. The plant breeding implications of these results are discussed.
Item Type: | Article |
---|---|
Divisions: | UNSPECIFIED |
CRP: | UNSPECIFIED |
Subjects: | Others > Wheat |
Depositing User: | Library ICRISAT |
Date Deposited: | 28 Dec 2011 09:57 |
Last Modified: | 28 Dec 2011 09:57 |
URI: | http://oar.icrisat.org/id/eprint/5075 |
Official URL: | http://dx.doi.org/10.1023/A:1003985429998 |
Projects: | UNSPECIFIED |
Funders: | African Development Bank |
Acknowledgement: | We are grateful to Prof. P.D.S. Caligari for reading and commenting upon this manuscript. We also thank the Uganda Grain Milling Company for logistic support and the African Development Bank for financial assistance |
Links: |
Actions (login required)
View Item |