Analysis of a combined F1/F2 diallel cross in wheat

    Hill, J and Wagoire, W W and Ortiz, R and Stlen, O (2001) Analysis of a combined F1/F2 diallel cross in wheat. TAG Theoretical and Applied Genetics, 102 (6-7). pp. 1076-1081. ISSN 1432-2242

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    Abstract

    Analysis of a conventional diallel cross offers only perfect-fit estimates of the genetic components of variation, but no test for the goodness of fit of the model based on these estimates. When F2 progenies are available, however, combining F1 and F2 diallels in a single experiment overcomes these problems. Least-square estimates of these components can be calculated, errors attached to them and the goodness of fit of the resultant model tested. This analysis was applied to data on the severity of yellow rust (caused by Puccinia striiformis) infection in an F1/F2 half-diallel cross among eight bread wheat lines adapted to the East African highlands. After removing two interacting arrays, genetic analysis indicated that an additive/dominance model of gene action satisfactorily explained the variation observed among the remaining six parents and their progenies, in both the individual F1 and F2 diallels and the combined F1/F2 diallel. Resistance to yellow rust was dominant to susceptibility and genes for increased resistance were more frequent.

    Item Type: Article
    Divisions: UNSPECIFIED
    CRP: UNSPECIFIED
    Uncontrolled Keywords: Grain yield · Quantitative genetics · Yellow rust
    Subjects: Others > Wheat
    Depositing User: Library ICRISAT
    Date Deposited: 26 Sep 2011 10:34
    Last Modified: 26 Sep 2011 10:41
    URI: http://oar.icrisat.org/id/eprint/1834
    Official URL: http://dx.doi.org/10.1007/s001220000451
    Projects: UNSPECIFIED
    Funders: African Development Bank
    Acknowledgement: We are grateful to Professor P.D.S. Caligari for reading and commenting upon this manuscript. We also thank the Uganda Grain Milling Company for logistic support and the African Development Bank for financial assistance.
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