Determining the impact of stripe rust and leaf rust on grain yield and yield components' losses in Indian wheat cultivars

Srinivas, K and Singh, V K and Srinivas, B and Sameriya, K K and Prasad, L and Singh, G P (2023) Determining the impact of stripe rust and leaf rust on grain yield and yield components' losses in Indian wheat cultivars. Cereal Research Communications, 13. pp. 1-14. ISSN 1788-9170

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Abstract

Rust diseases continue to cause economic losses to wheat production worldwide. Host-plant resistance significantly non-race-specific or combining race-specific and non-race-specific resistance is the most efficient, economic and ecofriendly way to control wheat rusts, besides eliminating the use of fungicides. Evidence on the effects of race-specific and non-race-specific resistance categories on stripe rust caused by Puccinia striiformis Westend. f. sp. tritici Eriks. and Henn and leaf rust (Puccinia triticina) development and in defending yield component losses in Indian wheat cultivars is still limited. Experiment was conducted to study the impacts of stripe rust and leaf rust on grain yield and yield components of some Indian wheat cultivars under artificial epiphytotic conditions. Cultivars with highly effective adult plant resistance to stripe rust viz. HD 2733, HD 2967, HD 3263, HS 562, NIAW 34, HI 1621, DBW 187, HD 3226, VL 829, VL 829, C 306, HD 3086, and NI 5439, and HD 3086, HD 3226, HI 1620, DBW 187, WH 1124, HI 1628, HS 562, RAJ 4496, MACS 6222, and VL 907 for resistance to leaf rust exhibited low values of epidemiological parameters as well as low yield components’ losses despite moderate disease levels might possessing APR gene(s). In this study, cultivars having slow rusting resistance with low values of epidemiological parameters were identified. These cultivars can be best utilized in varietal development programs to get improved varieties with high levels of durable resistance against novel virulent races of leaf rust.

Item Type:	Article
Divisions:	Global Research Program - Accelerated Crop Improvement
CRP:	UNSPECIFIED
Uncontrolled Keywords:	Durable resistance, Epidemiological parameters, Yr, Lr genes, Pathotypes
Subjects:	Others > Plant Pathology Others > Wheat
Depositing User:	Mr Nagaraju T
Date Deposited:	08 Jan 2024 04:41
Last Modified:	08 Jan 2024 04:41
URI:	http://oar.icrisat.org/id/eprint/12345
Official URL:	https://link.springer.com/article/10.1007/s42976-0...
Projects:	UNSPECIFIED
Funders:	UNSPECIFIED
Acknowledgement:	Authors are thankful to ICAR-Indian Institute of Wheat and Barley Research (IIWBR), Regional Station, Flowerdale, Shimla, Himachal Pradesh, India, for providing rust inoculum and support for conducting seedling resistance tests; and Borlaug Institute for South Asia (BISA), Ludhiana, Punjab, India, for supply of the seeds of exotic wheat genotypes/germplasm lines. There is no conflict of interest among the authors involved in this research. The valuable support received from our institute during the conduct of this research is highly acknowledged.
Links:	Google Scholar

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