Quantitative trait loci analysis for resistance to Cephalosporium stripe, a vascular wilt disease of wheat M CQuinckeauthor.et alauthorCephalosporium stripe, caused by Cephalosporium
gramineum, can cause severe loss of wheat
(Triticum aestivum L.) yield and grain quality and can be
an important factor limiting adoption of conservation tillage
practices. Selecting for resistance to Cephalosporium
stripe is problematic; however, as optimum conditions for
disease do not occur annually under natural conditions,
inoculum levels can be spatially heterogeneous, and little is
known about the inheritance of resistance. A population of
268 recombinant inbred lines (RILs) derived from a cross
between two wheat cultivars was characterized using field
screening and molecular markers to investigate the inheritance
of resistance to Cephalosporium stripe. Whiteheads
(sterile heads caused by pathogen infection) were measured on each RIL in three field environments under artificially
inoculated conditions. A linkage map for this population
was created based on 204 SSR and DArT markers. A total
of 36 linkage groups were resolved, representing portions
of all chromosomes except for chromosome 1D, which
lacked a sufficient number of polymorphic markers.
Quantitative trait locus (QTL) analysis identified seven
regions associated with resistance to Cephalosporium
stripe, with approximately equal additive effects. Four
QTL derived from the more susceptible parent (Brundage)
and three came from the more resistant parent (Coda), but
the cumulative, additive effect of QTL from Coda was
greater than that of Brundage. Additivity of QTL effects
was confirmed through regression analysis and demonstrates
the advantage of accumulating multiple QTL allelesto achieve high levels of resistanceWheat2011Springer VerlagArticle