Effects of Host Resistance, Temperature, and Duration of Wetness of Leaf Blight Development of Grain Sorghum

Karunakar, R I and Pande, S and Thakur, R P (1995) Effects of Host Resistance, Temperature, and Duration of Wetness of Leaf Blight Development of Grain Sorghum. Indian Journal of Plant Protection, 23 (2). pp. 146-151. ISSN 0253-4355

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Abstract

The effects of post-inoculation temperatures and periods of leaf wetness of leaf blight (Exserohilum turcicum (Pass.) Leonard and Suggs) development were studied in three sorghum genotypes (IS 3443C-40, ICSV 1, and 296B or Local FSRP) having varying levels of blight resistance. In two different experiments, pot-grown plants of these genotypes were spray-inoculated and subjected separately to i) six temperature regimes (10,15,20,25,30 and 35°C) for 24h with a 12h photoperiod and high relative humidity (100% RH) and ii) six periods of leaf wetness (RH-100%) of 2,4,6,8,24, and 48 h at 25°C Leaf blight severity (percentage leaf area damaged) was maximum (55%) at 25°C at 24 h of leaf wetness period in the susceptible genotypes Local FSRP and 296B. There was no leaf blight development at 10°C and 35°C and, significnatly, only low blight development (%) up to 8 h of leaf wetness. Implication of these findings in refining leaf blight screening technique is discussed.

Item Type:	Article
Divisions:	UNSPECIFIED
CRP:	UNSPECIFIED
Subjects:	Mandate crops > Sorghum
Depositing User:	Library ICRISAT
Date Deposited:	11 Dec 2011 11:16
Last Modified:	11 Dec 2011 11:16
URI:	http://oar.icrisat.org/id/eprint/4845
Official URL:	http://www.indianjournals.com/ijor.aspx?target=ijo...
Projects:	UNSPECIFIED
Funders:	UNSPECIFIED
Acknowledgement:	UNSPECIFIED
Links:	Author

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